X-Ray

Explore the structure of your crystalline product

- What are the crystallographic properties of my material?

Single Crystal X-Ray Diffractometers

Rigaku OD SuperNova GV1000 a diffractometer with microfocus Cu X-ray tube and CCD detector

Rigaku OD SuperNova Duo diffractometer with dual source microfocus Cu and Mo X-ray tubes and CCD detector

Rigaku OD MM007 XtaLab with high intensity rotating anode Cu X-ray source and Dectris Pilatus Hybrid Photon Counting detector

Data Collection in temperature range 80-500 K (Oxford Cryosystems Open Flow liquid nitrogen Cryostream Coolers)

Nikon Crosspolarising Microscope with digital display and image capture

Powder X-Ray Diffractometer

System:

Malvern PANalytical Xpert Pro Multipurpose Diffractometer system
Sealed tube Cu X-ray source with Johansson focussing beam Ge monochromator to select Ka1 wavelength radiation for high resolution data collection
PIXcel Area Detector for rapid data collection
Bragg-Brentano geometry goniometer operating in reflection mode with Programmable Divergence Slits and Programmable Anti-Scatter Slits to illuminate samples up to 20x20 mm in area
Automatic 45 position sample changer for high-throughput screening
Standard powder and air-sensitive sample holders

Advanced Configurations:

Anton Paar HTK 1200N High Temperature Oven Chamber for data collection (Bragg-Brentano reflection geometry) over range 25-1200 °C
Focussing Mirror Collimator and Capillary Spinner Stage for measuring high quality data in transmission mode
Transmission configuration
Small Angle X-ray Scattering configuration
Capability to run samples on Si wafer zero-background sample holders (user to provide wafers)