nmRC-Commercial
The JEOL 2100+ at the NMRC for state of the art TEM analysis

Transmission Electron Microscopy (TEM)

See down the the scale of molecules and atoms with TEM
 

TEM at a glance

TEM is a microscopy technique capable of providing very high resolution images down to a level of several Angstroms (~ 0.19nm). It images thin (100s nms) samples via the interaction of electrons as they pass through a specimen. Detecting a range of resultant secondary signals allows for the study of nano-scale morphological and chemical features of materials down to near atomic levels.

Applications

  • Bright field imaging
  • Electron diffraction
  • Dark field imaging
  • Energy Dispersive X-ray Spectroscopy (EDS)
  • Electron Energy Loss Spectroscopy (EELS)
  • Scanning Transmission Electron Spectroscopy (STEM)
  • Nanotomography (3D profiling)

 The FEI Tecnai 12 Biotwin at the NMRC

Images Courtesy of Vladimir Korolkov Photography and Lubrizol Ltd.

How does TEM work?

An electron source at the top of the microscope emits electrons that travel through a vacuum in the column of the microscope. Electromagnetic lenses are used to focus the electrons into a very thin beam and this is then directed through the specimen of interest. The electrons passing through the specimen then impact on a detector. Traditional bright field imaging relies on incident electrons being scattered and disappearing from the beam depending upon the compositional density and crystal orientation of the sample. The intensity of un-scattered electrons gives rise to a "shadow image" of the specimen, with different parts of a specimen displayed in varied darkness according to density. By rotating a sample, and taking multiple images at each rotation, it is also possible to build a 3D representation of the specimen (tomography).  

The crystal structure of samples with regular atomic structure (crystalline material) may also be analysed via electron diffraction. Positive interference in the back focal plane leads to discreet spots of electron localisation, which can then be visualised by mapping the back focal plane to the imaging apparatus. The diffraction patterns can then be used to analyse to the crystal structure of the specimen. 

X-ray emission consequent to the interaction of the primary electron beam with the sample, can also be detected by an energy-dispersive spectrometer (EDS) within the TEM. As the resulting X-ray energies are characteristic of the atomic structure of the element they originated from, the spectra generated can be used to identify the constituent elements.

It is also possible to measure the loss of energy from the inelastic scattering of electrons in specimen transmission (EELS). This information can be used to infer elemental composition, chemical bonding, valence and conduction band electronic properties.

 

Our TEM facilities

Hosted at the Nanoscale and Microscale Research Centre (nmRC).

Bright field and dark field detectors and X-Ray microanalysis or electron energy loss spectroscopy allow structural and elemental analysis
The JEOL 2100+ TEM at the NMRC.
Field emission electron gun (FEG) source provides a high brightness and high stability electron source.
 

 

JEOL 2100F FEG-TEM

 

 

JEOL 2100+ TEM

 

 

FEI Tecnai G12 12 Biotwin

 

 

  

Publications of Interest

Nanoscale and Microscale Research Centre

Cripps South building
University of Nottingham
University Park
Nottingham, NG7 2RD

telephone: +44 (0) 115 95 15046
email: nmcs@nottingham.ac.uk