Correlative Microscopy

Correlative Microscopy aims to link data obtained at the microscale to data at the nanoscale.

The NNNC aims to work with other microscopy facilities at The University of Nottingham where possible to enable this correlative work to be undertaken.

3D Correlative Microscopy

Facilities at the University make possible the correlative analysis of structures from the millimetre scale to the nanometre scale.

Tomography on the NNNC JEOL 2100F, FIB-SEM slice and view on the FEI Quanta 2003D in the NNNC, and 3D X-ray microscopy on the XRadia VersaXRM-500 in Electronic and Electrical Engineering covers the scale range from single nanometre to millimetre features, in three dimensions. 

With suitable reference markers and sample preparation, features can be referenced in XRM and then analysed in detail in FIBSEM and/or TEM tomography.

Field of View and Resolution for TEM tomography, FIB-SEM slice-and-view, and 3D X-ray microscopy