Hieu V Nguyen (Harry) has been awarded the Best Student Paper Award at the Second International Symposium, CompIMAGE 2010, Buffalo, NY, USA, held May 5-7, 2010 for Compact Binary Patterns (CBP) with Multiple Patch Classifiers for Fast and Accurate Face Recognition, Hieu V. Nguyen and Li Bai, published in Lecture Notes in Computer Science (LNCS) April 2010.
http://www.springerlink.com/content/h8g48122l128528v/
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