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Integrated Metrology for Precision Manufacturing Conference
22 - 23 January 2019, Knowledge Transfer Centre
Advanced Manufacturing Research Centre, Sheffield, UK

Proceedings

• Richard Leach – Integrated metrology for precision manufacturing (welcome talk)
• Richard Leach – Integrated metrology for precision manufacturing (closing talk)

Keynote talks

• Rob Dwyer-Joyce – Ultrasonic sensors for in-situ monitoring of manufacturing processes
• Toby Maw - Integrated information for improved quality
• Rab Scott – Factory 2050: manufacturing with data

Session 1: Sensor development

• Claudiu Giusca – State of the art review
• Wahyudin Syam – On development of a fast wireless focus variation probe for in-process surface measurement
• Tom Charrett – 3D positioning for industrial robotics
• Jeremy Coupland – Synthetic aperture interferometry: high-resolution optical measurement over an exceptionally large field of view
• Roger Artigas – Active illumination focus variation: rivalling confocal microscopy
• Ivan Zorin – Optical coherence tomography for non-destructive testing and imaging applications
• Ian McLean – Vision inspection advantages of mounting optical probes on five axis measurements systems

Session 2: Data handling

• David Butler – State of the art review
• Rufino Bolado-Gomez – Thinking data in aerospace manufacturing: present & future at CW Fletcher
• Moschos Papananias 
• Clifford Brown – Communication and validation for smart metrology data in IoT networks – SmartCon

Session 3: Process monitoring

• Jon Stammers – State of the art review
• Wahyudin Syam – Methodology for the development of in-line surface measuring instruments (with a case study)
• Tim Rooker – Machining centre monitoring with calibrated artefact probing
• Liam Blunt – In process surface metrology for roll to roll manufacture of printed electronic devices
• Florian Schwimmer – In-line measurements with focus variation as enabler for an autonomous manufacturing cell

Session 4: Process control

• Andrew Longstaff – State of the art review
• Chris Jones – Advances in metre traceability for industrial process control
• Oliver Martin – Benchmarking a new machine tool verification system
• Dariusz Ceglarek
• Patrick Keogh – Robotic machining with embedded feedback
• James Kratz – Flow-front measurement and simulation in liquid composite moulding